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"Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power ..."

A. Sasikumar et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.10.026

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/SasikumarACJSZR16
A. Sasikumar, A. R. Arehart, D. W. Cardwell, C. M. Jackson, W. Sun, Z. Zhang, S. A. Ringel:
Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power MISHEMTs. Microelectron. Reliab. 56: 37-44 (2016)

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