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"Study of the impact of electromigration on integrated circuit performance ..."

Rafael O. Nunes, R. L. de Orio (2017)

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DOI: 10.1016/J.MICROREL.2017.06.027

access: closed

type: Journal Article

metadata version: 2022-06-28

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Rafael O. Nunes, R. L. de Orio:
Study of the impact of electromigration on integrated circuit performance and reliability at design level. Microelectron. Reliab. 76-77: 75-80 (2017)

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