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"New ESD challenges in RFID manufacturing."

Peter Jacob, Uwe Thiemann (2017)

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DOI: 10.1016/J.MICROREL.2017.06.048

access: closed

type: Journal Article

metadata version: 2020-02-22

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Peter Jacob, Uwe Thiemann:
New ESD challenges in RFID manufacturing. Microelectron. Reliab. 76-77: 395-399 (2017)

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