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"Characterization on the thermal field inside IGBT cells during switching ..."

Xiao Ma et al. (2023)

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DOI: 10.1016/J.MEJO.2023.106016

access: closed

type: Journal Article

metadata version: 2024-01-13

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Xiao Ma, Yongle Huang, Fei Xiao, Yifei Luo, Tongyao Han:
Characterization on the thermal field inside IGBT cells during switching based on TCAD modeling and Thermoreflectance imaging. Microelectron. J. 142: 106016 (2023)

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