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"A new charge pump without degradation in threshold voltage due to body ..."

Jongshin Shin et al. (2000)

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DOI: 10.1109/4.859515

access: closed

type: Journal Article

metadata version: 2022-04-08

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  - https://dblp.org/rec/journals/jssc/ShinCPM00
Jongshin Shin, In-Young Chung, Young June Park, Hong-Shick Min:
A new charge pump without degradation in threshold voltage due to body effect [memory applications]. IEEE J. Solid State Circuits 35(8): 1227-1230 (2000)

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