TH Mismatch Self-Repair in 6T-SRAM With Asymmetric Pass Gate Transistor Formed by Post-Process Local Electron Injection.">TH Mismatch Self-Repair in 6T-SRAM With Asymmetric Pass Gate Transistor Formed by Post-Process Local Electron Injection., dblp, computer science, bibliography, knowledge graph, author, editor, publication, conference, journal, book, thesis, database, collection, open data, bibtex">

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"Improvement of Read Margin and Its Distribution by VTH Mismatch ..."

Kousuke Miyaji et al. (2011)

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DOI: 10.1109/JSSC.2011.2147030

access: closed

type: Journal Article

metadata version: 2020-08-30

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Kousuke Miyaji, Shuhei Tanakamaru, Kentaro Honda, Shinji Miyano, Ken Takeuchi:
Improvement of Read Margin and Its Distribution by V_TH Mismatch Self-Repair in 6T-SRAM With Asymmetric Pass Gate Transistor Formed by Post-Process Local Electron Injection. IEEE J. Solid State Circuits 46(9): 2180-2188 (2011)

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