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"A Generic Multi-Dimensional Scan-Control Scheme for Test-Cost Reduction."

Chia-Yi Lin, Hung-Ming Chen (2011)

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DOI: —

access: closed

type: Journal Article

metadata version: 2021-07-16

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  - electronic edition @ sinica.edu.tw (archived)
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  dblp key:
  - journals/jise/LinC11
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Chia-Yi Lin, Hung-Ming Chen:
A Generic Multi-Dimensional Scan-Control Scheme for Test-Cost Reduction. J. Inf. Sci. Eng. 27(6): 1943-1957 (2011)

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