default search action

combined dblp search
author search
venue search
publication search

ask others

"Novel method for detection of mixed-type defect patterns in wafer maps ..."

Tae San Kim et al. (2022)

> Home

Details and statistics

DOI: 10.1007/S10845-021-01755-6

access: closed

type: Journal Article

metadata version: 2022-07-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jim/KimLLS22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jim/KimLLS22
Tae San Kim, Jong Wook Lee, Won Kyung Lee, So Young Sohn:
Novel method for detection of mixed-type defect patterns in wafer maps based on a single shot detector algorithm. J. Intell. Manuf. 33(6): 1715-1724 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.