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"Towards a Test Definition Language for Integrated Circuits."

Mohammad R. Alshayeb et al. (2015)

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DOI: 10.1142/S0218126615500279

access: closed

type: Journal Article

metadata version: 2022-06-11

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  - https://dblp.org/rec/journals/jcsc/AlshayebEHAEB15
Mohammad R. Alshayeb, Muhammad E. S. Elrabaa, Ayman Hroub, Amran Al-Aghbari, Aiman H. El-Maleh, Abdelhafid Bouhraoua:
Towards a Test Definition Language for Integrated Circuits. J. Circuits Syst. Comput. 24(3): 1550027:1-1550027:19 (2015)

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