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"Self-correcting check bit generator of error correction codes for memories."

Sang-uhn Cha, Hongil Yoon (2013)

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DOI: 10.1587/ELEX.10.20130103

access: open

type: Journal Article

metadata version: 2021-02-12

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  - electronic edition via DOI (open access)
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  dblp key:
  - journals/ieiceee/ChaY13
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  - https://dblp.org/rec/journals/ieiceee/ChaY13
Sang-uhn Cha, Hongil Yoon:
Self-correcting check bit generator of error correction codes for memories. IEICE Electron. Express 10(6): 20130103 (2013)

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