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"Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power ..."

Yu Hu et al. (2006)

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DOI: 10.1093/IETISY/E89-D.10.2616

access: closed

type: Journal Article

metadata version: 2023-05-23

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  - https://dblp.org/rec/journals/ieicet/HuHLLW06
Yu Hu, Yinhe Han, Xiaowei Li, Huawei Li, Xiaoqing Wen:
Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time. IEICE Trans. Inf. Syst. 89-D(10): 2616-2625 (2006)

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