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"A study on the quality-embedded efficiency measurement in DEA."

Jaehun Park et al. (2018)

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DOI: 10.1080/03155986.2017.1393726

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - journals/infor/ParkSKLB18
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  - https://dblp.org/rec/journals/infor/ParkSKLB18
Jaehun Park, Si-Il Sung, Yong-Jeong Kim, Byung Kwon Lee, Hyerim Bae:
A study on the quality-embedded efficiency measurement in DEA. INFOR Inf. Syst. Oper. Res. 56(2): 247-263 (2018)

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