default search action

combined dblp search
author search
venue search
publication search

ask others

"Expected affine: A registration method for damaged section in serial ..."

Tong Xin et al. (2022)

> Home

Details and statistics

DOI: 10.3389/FNINF.2022.944050

access: open

type: Journal Article

metadata version: 2023-05-08

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/fini/XinSLCH22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/fini/XinSLCH22
Tong Xin, Lijun Shen, Linlin Li, Xi Chen, Hua Han:
Expected affine: A registration method for damaged section in serial sections electron microscopy. Frontiers Neuroinformatics 16 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.