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"Revisit to Histogram Method for ADC Linearity Test: Examination of Input ..."

Yujie Zhao et al. (2022)

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DOI: 10.1007/S10836-022-05988-Y

access: closed

type: Journal Article

metadata version: 2022-05-18

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  - https://dblp.org/rec/journals/et/ZhaoKKKWKNHSIOI22
Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa:
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. J. Electron. Test. 38(1): 21-38 (2022)

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