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"A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits."

Congyin Shi et al. (2018)

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DOI: 10.1007/S10836-018-5713-1

access: closed

type: Journal Article

metadata version: 2022-01-03

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  - https://dblp.org/rec/journals/et/ShiLAS18
Congyin Shi, Sanghoon Lee, Sergio Soto Aguilar, Edgar Sánchez-Sinencio:
A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits. J. Electron. Test. 34(3): 313-320 (2018)

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