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"Quiescent current analysis and experimentation of defective CMOS circuits."

Jaume A. Segura et al. (1992)

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DOI: 10.1007/BF00135337

access: closed

type: Journal Article

metadata version: 2022-11-20

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  - https://dblp.org/rec/journals/et/SeguraCRFR92
Jaume A. Segura, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio:
Quiescent current analysis and experimentation of defective CMOS circuits. J. Electron. Test. 3(4): 337-348 (1992)

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