default search action

combined dblp search
author search
venue search
publication search

ask others

"Interconnect Reliability Analysis for Power Amplifier Based on Artificial ..."

Qian Lin et al. (2016)

> Home

Details and statistics

DOI: 10.1007/S10836-016-5606-0

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/LinFHC16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/LinFHC16
Qian Lin, Haipeng Fu, Feifei He, Qian-Fu Cheng:
Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural Networks. J. Electron. Test. 32(4): 481-489 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.