default search action

combined dblp search
author search
venue search
publication search

ask others

"One More Class of Sequential Circuits having Combinational Test Generation ..."

Debesh Kumar Das, Hideo Fujiwara (2015)

> Home

Details and statistics

DOI: 10.1007/S10836-015-5527-3

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/DasF15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/DasF15
Debesh Kumar Das, Hideo Fujiwara:
One More Class of Sequential Circuits having Combinational Test Generation Complexity. J. Electron. Test. 31(3): 321-327 (2015)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.