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"Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron ..."

Jaume Segura, Peter C. Maxwell (2002)

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DOI: 10.1109/MDT.2002.1033786

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/dt/SeguraM02
Jaume Segura, Peter C. Maxwell:
Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era. IEEE Des. Test Comput. 19(5): 5-7 (2002)

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