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"A Reliability-Aware Joint Design Method of Application Mapping and ..."

Hui Li et al. (2020)

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DOI: 10.1109/ACCESS.2020.2987928

access: open

type: Journal Article

metadata version: 2020-06-17

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  dblp key:
  - journals/access/LiLGCY20
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  - https://dblp.org/rec/journals/access/LiLGCY20
Hui Li, Feiyang Liu, Huaxi Gu, Zhuqin Chu, Xiaochun Ye:
A Reliability-Aware Joint Design Method of Application Mapping and Wavelength Assignment for WDM-Based Silicon Photonic Interconnects on Chip. IEEE Access 8: 73457-73474 (2020)

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