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"Defect Analysis: Basic Techniques for Management and Learning."

David N. Card (2005)

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DOI: 10.1016/S0065-2458(05)65006-1

access: closed

type: Journal Article

metadata version: 2020-05-20

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David N. Card:
Defect Analysis: Basic Techniques for Management and Learning. Adv. Comput. 65: 260-297 (2005)

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