default search action

combined dblp search
author search
venue search
publication search

ask others

"An oversampling method for wafer map defect pattern classification ..."

Eun-Su Kim et al. (2021)

> Home

Details and statistics

DOI: 10.1016/J.CIE.2021.107767

access: closed

type: Journal Article

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/candie/KimCLKBO21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/candie/KimCLKBO21
Eun-Su Kim, Seung-Hyun Choi, Dong-Hee Lee, Kwang-Jae Kim, Young-Mok Bae, Young-Chan Oh:
An oversampling method for wafer map defect pattern classification considering small and imbalanced data. Comput. Ind. Eng. 162: 107767 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.