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"A Multilevel Test and Evaluation Modularization for Test Event Optimization."

Seunglim Lee, Mahmoud Efatmaneshnik, Ady James (2024)

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DOI: 10.1109/SYSCON61195.2024.10553569

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Seunglim Lee, Mahmoud Efatmaneshnik, Ady James:
A Multilevel Test and Evaluation Modularization for Test Event Optimization. SysCon 2024: 1-6

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