default search action

combined dblp search
author search
venue search
publication search

ask others

"In-depth Analysis of the Effects of Electromagnetic Fault Injection Attack ..."

Jinteng Jiao et al. (2022)

> Home

Details and statistics

DOI: 10.1109/SOCC56010.2022.9908097

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/socc/JiaoLFQL22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/socc/JiaoLFQL22
Jinteng Jiao, He Li, Yanzhao Feng, Chengdong Qian, Qiang Liu:
In-depth Analysis of the Effects of Electromagnetic Fault Injection Attack on a 32-bit MCU. SOCC 2022: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.