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"Software Defect Prediction via Positional Hierarchical Attention Network (S)."

Xinyan Yi et al. (2023)

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DOI: 10.18293/SEKE2023-119

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-06

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  dblp key:
  - conf/seke/YiX0ZY23
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  - https://dblp.org/rec/conf/seke/YiX0ZY23
Xinyan Yi, Hao Xu, Lu Lu, Quanyi Zou, Zhanyu Yang:
Software Defect Prediction via Positional Hierarchical Attention Network (S). SEKE 2023: 228-231

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