default search action

combined dblp search
author search
venue search
publication search

ask others

"How Does Defect Removal Activity of Developer Vary with Development ..."

Reou Ando et al. (2015)

> Home

Details and statistics

DOI: 10.18293/SEKE2015-221

access: open

type: Conference or Workshop Paper

metadata version: 2021-02-03

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - conf/seke/AndoSUWFIOHKSNY15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/seke/AndoSUWFIOHKSNY15
Reou Ando, Seiji Sato, Chihiro Uchida, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Masanobu Kanazawa, Kazutaka Sone, Katsushi Namba, Mikihiko Yamamoto:
How Does Defect Removal Activity of Developer Vary with Development Experience? SEKE 2015: 540-545

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.