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"Real-time and near-real-time acquisition systems for measuring aliasing in ..."

Zhenchun Xia et al. (2013)

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DOI: 10.1109/RWS.2013.6486642

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

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Zhenchun Xia, Nick Brennan, Jean-François Chamberland, Gregory H. Huff:
Real-time and near-real-time acquisition systems for measuring aliasing in small arrays based on crystal microstructures. RWS 2013: 64-66

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