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"Degradation Delay Model Extension to CMOS Gates."
Jorge Juan-Chico et al. (2000)
- Jorge Juan-Chico, Manuel J. Bellido, Paulino Ruiz-de-Clavijo, Antonio J. Acosta, Manuel Valencia-Barrero:
Degradation Delay Model Extension to CMOS Gates. PATMOS 2000: 149-158
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