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"Thermally-induced soft errors in nanoscale CMOS circuits."

Hua Li et al. (2007)

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DOI: 10.1109/NANOARCH.2007.4400859

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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  dblp key:
  - conf/nanoarch/LiMPKZB07
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  persistent URL:
  - https://dblp.org/rec/conf/nanoarch/LiMPKZB07
Hua Li, Joseph L. Mundy, William R. Patterson, Dimitrios Kazazis, Alexander Zaslavsky, R. Iris Bahar:
Thermally-induced soft errors in nanoscale CMOS circuits. NANOARCH 2007: 62-69

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