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"Surface Potential Measurement of a Silicon Fast Recovery Diode under ..."

Takeshi Uruma et al. (2018)

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DOI: 10.1109/MHS.2018.8887070

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-07

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  - conf/mhs/UrumaSYI18
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Takeshi Uruma, Nobuo Satoh, Hidekazu Yamamoto, Futoshi Iwata:
Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy. MHS 2018: 1-4

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