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Futoshi Iwata
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2020 – today
- 2022
- [j2]Kenta Nakazawa
, Kengo Fukazawa
Imaging of an Electret Film Fabricated on a Micro-Machined Energy Harvester by a Kelvin Probe Force Microscope. IEEE Trans. Instrum. Meas. 71: 1-7 (2022)
2010 – 2019
- 2019
- [c14]Kenta Katakura, Kenta Nakazawa, Futoshi Iwata:
Manipulation of one-dimensional nanomaterials using a high-speed atomic force microscope in tapping mode. MHS 2019: 1-4 - 2018
- [c13]Takeshi Uruma, Nobuo Satoh, Hidekazu Yamamoto, Futoshi Iwata:
Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy. MHS 2018: 1-4 - [c12]Masayoshi Yoshioka, Futoshi Iwata:
Micro Fabrication Technique for Three-dimensional Structures based on Localized Electrophoretic Deposition using a Scanning Ion Conductance Microscope. MHS 2018: 1-4 - 2017
- [c11]Tatsuru Shirasawa, Yusuke Mizutani, Tatsuo Ushiki, Futoshi Iwata:
Topographical imaging and charge mapping of charged surface using scanning ion conductance microscopy with a theta nanopipette. MHS 2017: 1-5 - [c10]Sho Yamamoto, Daisuke Morimatsu, Hiromitsu Nakamura, Akihisa Ogino
Fine processing of polymer surface by irradiating local atmospheric pressure plasma jets using helium source gas mixed with water vapor. MHS 2017: 1-5 - 2016
- [c9]Kohei Iwasaki, Yuki Takeda, Futoshi Iwata:
Nanomanipulator based on a high-speed atomic force microscope capable of controlling a cantilever loading force using a magnetic solenoid. MHS 2016: 1-5 - 2015
- [c8]Shigetaka Hashimoto, Futoshi Iwata:
Measurement of shear force and adhesion force of a single adhesion cell using atomic force microscopy with a self-sensitive cantilever. MHS 2015: 1-6 - 2014
- [c7]Shigetaka Hashimoto, Makoto Adachi, Futoshi Iwata:
Directly measurement of shear force of a single adhesion cell using a self-sensitive cantilever. MHS 2014: 1-6 - [c6]Satoshi Sakurai, Koji Yamazaki, Tatsuo Ushiki, Futoshi Iwata:
Development of a single cell electroporation method using a scanning ion conductance microscope with a theta type probe pipette. MHS 2014: 1-5 - 2013
- [c5]Kimihiro Ishizaki, Tatsuo Ushiki, Masato Nakajima, Futoshi Iwata:
Influence of charged samples on imaging in scanning ion conductance microscopy. MHS 2013: 1-4 - 2012
- [c4]Makoto Adachi, Yuya Mizuguchi, Futoshi Iwata:
Single cell scraper based on an Atomic Force Microscope. MHS 2012: 64-69 - 2011
- [c3]Masaki Takahashi, Hideyuki Ko, Tatsuo Ushiki, Futoshi Iwata:
Interactive nano manipulator based on an atomic force microscope for scanning electron microscopy. MHS 2011: 495-500 - [c2]Futoshi Iwata:
Development of novel nanomanipulators based on scanning probe microscopes. MHS 2011: 529
1990 – 1999
- 1995
- [j1]Hisayuki Aoyama, Futoshi Iwata, Jisuke Fukaya, Akira Sasaki:
Miniature Robot with Micro Capillary Capturing Probe for Surface Clearing Operation. J. Robotics Mechatronics 7(6): 488-492 (1995) - [c1]Hisayuki Aoyama, Futoshi Iwata, Akira Sasaki:
Desktop Teleoperation via the World Wide Web. ICRA 1995: 660-665
Coauthor Index
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