default search action

combined dblp search
author search
venue search
publication search

ask others

"IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT ..."

Peiyu Liu et al. (2021)

> Home

Details and statistics

DOI: 10.1109/ASE51524.2021.9678785

access: closed

type: Conference or Workshop Paper

metadata version: 2023-04-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/kbse/LiuJ0DLFCCWB21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/kbse/LiuJ0DLFCCWB21
Peiyu Liu, Shouling Ji, Xuhong Zhang, Qinming Dai, Kangjie Lu, Lirong Fu, Wenzhi Chen, Peng Cheng, Wenhai Wang, Raheem Beyah:
IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware. ASE 2021: 805-816

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.