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"Identifying well-oriented diffraction patterns in XFEL datasets."

David H. Wojtas et al. (2016)

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DOI: 10.1109/IVCNZ.2016.7804463

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/ivcnz/WojtasSACM16
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  - https://dblp.org/rec/conf/ivcnz/WojtasSACM16
David H. Wojtas, Carolin Seuring, Kartik Ayyer, Henry N. Chapman, Rick P. Millane:
Identifying well-oriented diffraction patterns in XFEL datasets. IVCNZ 2016: 1-6

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