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"Magnetic Coupling Based Test Development for Contact and Interconnect ..."

Sicong Yuan et al. (2023)

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DOI: 10.1109/ITC51656.2023.00040

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-22

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  - https://dblp.org/rec/conf/itc/YuanZFXMKRCTH23
Sicong Yuan, Ziwei Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. ITC 2023: 236-245

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