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"Enhanced reduced pin-count test for full-scan design."

Harald P. E. Vranken et al. (2001)

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DOI: 10.1109/TEST.2001.966695

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/VrankenWFL01
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  persistent URL:
  - https://dblp.org/rec/conf/itc/VrankenWFL01
Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier:
Enhanced reduced pin-count test for full-scan design. ITC 2001: 738-747

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