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"Iterative Test Generation for Gate-Exhaustive Faults to Cover the Sites of ..."

Irith Pomeranz (2019)

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DOI: 10.1109/ITC44170.2019.9000124

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-24

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  dblp key:
  - conf/itc/Pomeranz19
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  - https://dblp.org/rec/conf/itc/Pomeranz19
Irith Pomeranz:
Iterative Test Generation for Gate-Exhaustive Faults to Cover the Sites of Undetectable Target Faults. ITC 2019: 1-7

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