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"Circuit failure prediction to overcome scaled CMOS reliability challenges."

Subhasish Mitra, Mridul Agarwal (2007)

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DOI: 10.1109/TEST.2007.4437665

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/itc/MitraA07
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  - https://dblp.org/rec/conf/itc/MitraA07
Subhasish Mitra, Mridul Agarwal:
Circuit failure prediction to overcome scaled CMOS reliability challenges. ITC 2007: 1-3

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