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"The Advanced Test System Architecture Provides Fast and Accurate Test for ..."

Akinori Maeda (1992)

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DOI: 10.1109/TEST.1992.527805

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Akinori Maeda:
The Advanced Test System Architecture Provides Fast and Accurate Test for a High Resolution ADC. ITC 1992: 68-75

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