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Akinori Maeda

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2010 – 2019

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2011
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Yasuhiro Takahashi, Akinori Maeda, Mitsuhiro Ogura:
Actual implementation of multi domain test: Further reduction of cost of test. ITC 2011: 1-8
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Yasuhiro Takahashi, Akinori Maeda:
Multi Domain Test: Novel test strategy to reduce the Cost of Test. VTS 2011: 303-308

2000 – 2009

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2008
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Akinori Maeda:
Low Distortion Sine Waveform Generation by an AWG. ATS 2008: 147
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Akinori Maeda:
A Method to Generate a Very Low Distortion, High Frequency Sine Waveform Using an AWG. ITC 2008: 1-8
2007
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Akinori Maeda:
How the noise floor affects the production yield. ATS 2007: 474

1990 – 1999

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1992
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Akinori Maeda:
The Advanced Test System Architecture Provides Fast and Accurate Test for a High Resolution ADC. ITC 1992: 68-75

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