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"Low cost testing of multi-GBit device pins with ATE assisted loopback ..."

William Fritzsche, Asim E. Haque (2008)

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DOI: 10.1109/TEST.2008.4700558

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/itc/FritzscheH08
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  - https://dblp.org/rec/conf/itc/FritzscheH08
William Fritzsche, Asim E. Haque:
Low cost testing of multi-GBit device pins with ATE assisted loopback instrument. ITC 2008: 1-8

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