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"Static component interconnect test technology (SCITT) a new technology for ..."

Alex S. Biewenga et al. (1999)

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DOI: 10.1109/TEST.1999.805766

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/itc/BiewengaHJL99
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Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg:
Static component interconnect test technology (SCITT) a new technology for assembly testing. ITC 1999: 439-448

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