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"End-to-end testing for boards and systems using boundary scan."

Robert W. Barr, Chen-Huan Chiang, Edward L. Wallace (2000)

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DOI: 10.1109/TEST.2000.894252

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/BarrCW00
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  persistent URL:
  - https://dblp.org/rec/conf/itc/BarrCW00
Robert W. Barr, Chen-Huan Chiang, Edward L. Wallace:
End-to-end testing for boards and systems using boundary scan. ITC 2000: 585-592

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