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"The testability features of the 3rd generation ColdFire family of ..."

Alfred L. Crouch et al. (1999)

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DOI: 10.1109/TEST.1999.805823

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/CrouchMMPT99
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  - https://dblp.org/rec/conf/itc/CrouchMMPT99
Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran:
The testability features of the 3rd generation ColdFire family of microprocessors. ITC 1999: 913-922

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