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"Fundamental understanding of NBTI degradation mechanism in IGZO channel ..."

Ying Zhao et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529352

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-31

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  dblp key:
  - conf/irps/ZhaoRCTKRDBWKF24
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  - https://dblp.org/rec/conf/irps/ZhaoRCTKRDBWKF24
Ying Zhao, Pietro Rinaudo, Adrian Vaisman Chasin, Brecht Truijen, Ben Kaczer, Nouredine Rassoul, Harold Dekkers, Attilio Belmonte, Ingrid De Wolf, Gouri Sankar Kar, Jacopo Franco:
Fundamental understanding of NBTI degradation mechanism in IGZO channel devices. IRPS 2024: 1-7

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