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"Investigation of Positive Bias Temperature Instability in advanced FinFET ..."

Yongkang Xue et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529402

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-03

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  - conf/irps/XueYLWWRZWJH24
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  - https://dblp.org/rec/conf/irps/XueYLWWRZWJH24
Yongkang Xue, Miaojia Yuan, Yu Li, Da Wang, Maokun Wu, Pengpeng Ren, Lining Zhang, Runsheng Wang, Zhigang Ji, Ru Huang:
Investigation of Positive Bias Temperature Instability in advanced FinFET nodes. IRPS 2024: 1-5

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