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"Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet ..."

Michiel Vandemaele et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764470

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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  dblp key:
  - conf/irps/VandemaeleKTBCF22
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  - https://dblp.org/rec/conf/irps/VandemaeleKTBCF22
Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Erik Bury, Adrian Vaisman Chasin, Jacopo Franco, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken:
Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs. IRPS 2022: 6

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