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"Recent advances in in-situ and in-field aging monitoring and compensation ..."

Mingoo Seok et al. (2018)

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DOI: 10.1109/IRPS.2018.8353612

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-29

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  dblp key:
  - conf/irps/SeokKYLK18
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  - https://dblp.org/rec/conf/irps/SeokKYLK18
Mingoo Seok, Peter R. Kinget, Teng Yang, Jiangyi Li, Doyun Kim:
Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper. IRPS 2018: 5

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