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"Towards the Characterization of Full ID-VG Degradation in Transistors for ..."

Pengpeng Ren et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764579

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-03

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  dblp key:
  - conf/irps/RenZLWJH22
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  - https://dblp.org/rec/conf/irps/RenZLWJH22
Pengpeng Ren, Xinfa Zhang, Junhua Liu, Runsheng Wang, Zhigang Ji, Ru Huang:
Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications. IRPS 2022: 3

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