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"Gate Driver Protection Methods for SiC MOSFET Short Circuit Testing."

Jairo Nevarez et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405170

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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  dblp key:
  - conf/irps/NevarezOWP21
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  - https://dblp.org/rec/conf/irps/NevarezOWP21
Jairo Nevarez, Anthony Olmedo, Rachel Williams, Polina Pechnikova:
Gate Driver Protection Methods for SiC MOSFET Short Circuit Testing. IRPS 2021: 1-4

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