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"The Throughput of Sequential Testing."

Murali S. Kodialam (2001)

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DOI: 10.1007/3-540-45535-3_22

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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  dblp key:
  - conf/ipco/Kodialam01
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Murali S. Kodialam:
The Throughput of Sequential Testing. IPCO 2001: 280-292

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